ROUGHNESS ANALYSIS AND DETERMINING DISPLACEMENT IN NICKEL-TITANIUM ALLOY BY ATOMIC FORCE MICROSCOPY
DOI:
https://doi.org/10.15649/2346075X.360Keywords:
Roughness, displacement, atomic force microscopy, Nickel-titanium alloys.Abstract
Introduction: In this research an alloy of nickel (Ni) and Titanium (Ti) is analyzed. Such materials possess the physical property of shape memory; which consists of applying an initial deformation to the material, it can return to its original state by applying an external stimulus (temperature or power). Methods: Using an Atomic Force Microscope (AFM) and based on the information provided by the AFM data of displacement experienced by the material using sampling regions of 1 x 1 micron were obtained. Roughness analysis of the material, considering the topography variation as the sample is compressed was also carried out. Results and Discussion: The transition occurs in the material passing an austenite phase to a martensitic phase when the material is subjected to compression to be a final state of stable transformation. Conclusions: When the AFM is used in contact mode allows observing the change the topography of the sample which determine the behavior of the roughness, as evident in a decrease of material as it is compressed and in contact mode lateral force. With the former wereable to observe how the grouped rotate on the surface, when an external force is applied particles.
References
De La Flor S. Aleaciones con memoria de forma.Tesis Doctoral. Universidad Politécnica de Cataluña. España. 1999.
Digital Instruments CP-II User’s guide part I: Basic imaging techniques. Copyright. Veeco Instruments Inc. Santa Barbara California USA. 2004; 56-62.
Digital Instruments CP-II User’s guide part II: advanced techniques. Copyright Veeco Instruments Inc. Santa Barbara California USA, 2004; 15- 19
Kaupp, G. Atomic force microscopy on photoreactive organic solids: nanostructures. Mol. Cryst. Liq.Cryst. 1994; 252(1):259-68.
Mendoza Carreño, E. Medida de las deformaciones por temperatura en materiales metálicos mediante métodos interferometricos. Tesis de grado. Universidad Industrial de Santander. 2007.
Palomo M, Ormeño S, Rincón JA. El formato HDF:Un modelo de datos para el almacenamiento y gestión de información espacial de carácter ambiental. Universidad Politécnica de Madrid y CONACYT, Colegio de Postgraduados, México. Poster.
Horcas, I., Fernández, R., Gomez-Rodriguez, J.M., Colchero, J., Gómez-Herrero, J. W. S. X. M., & Baro, A. M.. WSXM: a software for scanning probe microscopy and a tool for nanotechnology. Rev. Sci.Instrum. 2007; 78(1): 013705.
Rivera MH, Melo ER. La rugosidad de las superficies: Topometría. Ingenierías, 2001; 4(11):27.
Downloads
Published
How to Cite
Issue
Section
Altmetrics
Downloads
License
All articles published in this scientific journal are protected by copyright. The authors retain copyright and grant the journal the right of first publication, with the work simultaneously licensed under a Creative Commons Attribution-NonCommercial 4.0 International License (CC BY-NC 4.0), which permits sharing the work with authorship recognition and without commercial purposes.
Readers may copy and distribute the material from this journal issue for non-commercial purposes in any medium, provided the original work is cited and credit is given to the authors and the journal.
Any commercial use of the material from this journal is strictly prohibited without written permission from the copyright holder.
For more information on the copyright of the journal and open access policies, please visit our website.